Use AFM Image Processing to View the Topography of Nanoscale Samples


Posted July 25, 2018 by parksystems7

Learn More by Viewing Example Images Produced by Park Systems Devices
 
In previous years, studying materials at the nanoscale was something we only thought possible in science fiction movies. Today, it is becoming easier and easier with the advancement of Atomic Force Microscopy or AFM. A nanometer is an extremely small measure, being one billionth of a meter. This is the length scale at which intermolecular force and quantum effect take hold, which can show us an entirely new world through proper study.
The purpose of AFM is to create an image of the sample that is being studied. However, not all of these devices are created equally and finding the best microscope for your needs is crucial to proper research. Perhaps the biggest manufacturer in the AFM work at this time is Park Systems. They are creating the most innovative and newest devices that you can purchase today. Through the use of their microscopy, you can create some of the most in depth and highest quality images possible.
The AFM devices at Park Systems work through the use of a cantilever which contains a very sharp tip. This tip will scan over the sample’s surface and as the tip approaches the surface itself, attractive force will cause it to deflect towards said surface. When the tip makes contact with the surface, it will deflect away using repulsive force. These movements are recorded using an innovative laser beam.
The experts at Park Systems have designed one of the best position-sensitive photo diodes to track these changes. This means that even the smallest movements as the cantilever passes across the surface of the sample will be recorded properly. Using these AFM devices can help you create quality images of the topography of a sample’s surface, specifically in a specific region of interest. Through these images, you can learn important information regarding the sample which can be extremely beneficial to our daily lives.
Keibock Lee, President of Park Systems, commented, “Our AFM devices are amongst the best on the market today, leading to the best images possible for researching at the nanoscale. These microscopy products are made to generate an accurate topographic map of the surface features of the sample you are studying. You can see example images that have been produced with a variety of our AFM devices on our company website. We also have detailed information on which devices work best for your specific industry and needs and are available to answer questions as needed.”
About Us: Park Systems is a leading manufacturer of atomic force microscopy systems with a full range of products. Multiple industries, such as engineers in chemistry, materials, physics, life sciences, semiconductor, and data storage can benefit from their range of supplies. The products produced by Park Systems are represented in thousands of institutions and businesses worldwide. The main headquarters for this company is based in Santa Clara, California, but products produced are sold and supported worldwide with the many regional offices throughout the world. Each of Park Systems products are sold at the lowest operating cost, with high data accuracy, and superior productivity. To learn more about their products, please visit their website.
http://www.parkafm.com
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Issued By Park Systems
Phone 408-986-1110
Business Address 3040 Olcott Street Santa Clara, CA United States 95054
Country United States
Categories Technology
Tags afm manufacturer , atomic force microscope manufacturer , atomic force microscopy applications , scanning probe , scanning probe microscope
Last Updated July 25, 2018